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Boundary Scan module extends structural test coverage to DIMM240 interfaces

Boundary Scan Products
Boundary Scan module extends structural test coverage to DIMM240 interfaces

Boundary Scan module extends structural test coverage to DIMM240 interfaces
Goepel electronic has announced the market introduction of CION Module/DIMM240 as another Boundary Scan I/O module of the CION product family. The digital low cost module is serially controlled via TAP to special CION ASIC chips, and enables the testing of all signal and voltage supply pins of JEDEC Std. compliant DIMM240 sockets for DDR2- SDRAM. “The structural test of interfaces has become increasingly important for our customers. With our CION module family we are admittedly offering the widest product range inclusive solutions for the analogue and digital field”, says Raj Puri, Vice President Sales and Marketing for Goepel electronics LLC. “We have expanded our leading position with this new CION module.” The CION Module/DIMM240 is already the 13th module within the CION module family. It is plugged into a respective socket, whereby the interface stages’ voltages are adapted automatically. Because the modules are equipped with a transparent TAP, several boards of the same or different types can be cascaded in a Daisy chain configuration. The structural Boundary Scan test of all DIMM240 signal and voltage supply pins are executed by the on-board CION ASIC ICs. All channels can be independently switched as Input/Output/Tristate.

To ensure protection of test equipment and unit under test (UUT), the module provides special safety mechanisms such as “Unstress” to prevent damages in case of shorts, extended power yield and voltage programmable TAP. These features guarantee not only a high reliability and flexibility but also outstanding safety and extendibility. The new hardware module is completely supported by all JTAG/Boundary Scan controllers of the ScanBooster and Scanflex families as well as the integrated Boundary Scan software platform System Cascon. Users are now able to easily integrate the CION Module/DIMM240 into a respective test project with fully automatically generated test vectors. Any faults can be interactively debugged and visualised graphically at pin and net level in the layout and schematic.
electronica, booth A1.542
EPP Europe 433
Current Issue
Titelbild EPP EUROPE Electronics Production and Test 11
Issue
11.2023
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