Homepage » Top-News »

Partnership to enhance product-centric design platform with a design for test capability

DFT Assistant for CR-8000 PCB design suite
Partnership to enhance product-centric design platform with a design for test capability

Zuken and XJTAG, leaders in boundary scan and design for test technology, have entered into a partnership to enhance Zuken’s CR-8000 with a design for test (DFT) capability that will improve test coverage during schematic entry. The capability is based on XJTAG’s DFT Assistant, and will be available later this year as a free plugin for the CR-8000 Design Gateway users.

CR-8000 is a native 3D product-centric design platform for PCB-based systems. CR-8000 directly supports architecture design, concurrent multi-board PCB design, chip/package/board co-design and full 3D MCAD co-design. CR-8000 Design Gateway is a platform for logical circuit design and verification.

Validate JTAG chain connectivity

Increasingly, printed circuit boards (PCBs) are densely populated making it difficult to gain manufacturing test access to pins under many packages, such as ball grid arrays (BGAs). JTAG was designed to enable test access, so an optimized design can have a positive impact on ROI. Failure to optimize JTAG test coverage at an early design stage can increase manufacturing costs and possibly require a board re-design.

The DFT Assistant will help to validate correct JTAG chain connectivity while displaying boundary scan access and coverage onto the schematic diagram through full integration with CR-8000 Design Gateway.

Simon Payne, CEO of XJTAG, says: “We are pleased to be joining Zuken’s solution ecosystem. Companies need to determine early in the design phase how to maximize test coverage using the minimum number of test points, so it is essential to know what JTAG access is available at the schematic stage of the design process. The XJTAG DFT Assistant for Zuken’s CR-8000 Design Gateway will make it easy to see the test access as the design evolves. This allows test engineers to significantly optimize testing before PCBs are produced.”

Bob Potock, Vice President of Marketing at Zuken USA, Inc, says: “Boundary scan technology and XJTAG’s DFT Assistant will enable engineers to build, optimize, and measure the chain’s test coverage at the schematic entry stage. For our customers, this enhancement will mean better test coverage that translates into better manufacturing yields and lower costs.”

www.zuken.com and www.xjtag.com/zuken

Current Issue
Titelbild EPP EUROPE Electronics Production and Test 11
Issue
11.2023
READ
Newsletter

Subscribe to our newsletter now

Webinars & Webcasts

First hand technical knowledge

Whitepapers

Find all current Whitepapers here

Videos

Find all current videos here


Industrie.de Infoservice
Vielen Dank für Ihre Bestellung!
Sie erhalten in Kürze eine Bestätigung per E-Mail.
Von Ihnen ausgesucht:
Weitere Informationen gewünscht?
Einfach neue Dokumente auswählen
und zuletzt Adresse eingeben.
Wie funktioniert der Industrie.de Infoservice?
Zur Hilfeseite »
Ihre Adresse:














Die Konradin Verlag Robert Kohlhammer GmbH erhebt, verarbeitet und nutzt die Daten, die der Nutzer bei der Registrierung zum Industrie.de Infoservice freiwillig zur Verfügung stellt, zum Zwecke der Erfüllung dieses Nutzungsverhältnisses. Der Nutzer erhält damit Zugang zu den Dokumenten des Industrie.de Infoservice.
AGB
datenschutz-online@konradin.de